Almost Unbiased Ratio Cum Product Estimators for Finite Population Mean
with Known Ranges and Its Functions
pp. 645-663
Jambulingam Subramani and Master Ajith
S
Designing of Bayesian Skip-Lot Sampling Plan -V with MDS (0, 1) as
Reference Plan indexed through Quality Decision Regions
pp. 665-667
K.K.Suresh and Nirmala.V
Estimation of Parameters of Three Parameter Esscher Transformed Laplace
Distribution
pp. 669-675
Dais George and Rimsha H
An
Engineering System with three Degradations and Post Repair: A Stochastic
Study
pp. 677-704
Shinjita Agrawal
Comparative Analysis of Two-Unit Hot Standby Hardware-Software Systems
with Impact of Imperfect Fault Coverages
pp. 705-719
Sudesh Kumari and Rajeev Kumar
Bayes Estimator for Coefficient of Variation and Inverse Coefficient of
Variation for the Normal Distribution
pp. 721-732
Aruna Kalkur T. and Aruna Rao
A
Study on Awareness of Cancer among College Students in Thanjavur
pp. 733-739
Sakthivel. E, Logaraj. M and Anitha .S
Variable selection in nonparametric additive models with measurement
errors
pp. 741-761
Zanhua Yin and Fang Liu
Design and Development of Three Stages Mixed Sampling Plans for Variable
Attribute Variable Quality Characteristics
pp. 763-772
S. Devaarul and D. Senthil Kumar
On
skew q-gaussian distribution
pp. 773789
Masahiro Tasaki and Ken-ichi Koike
Bayesian and E- Bayesian Method of Estimation of Parameter of Rayleigh
Distribution- A Bayesian Approach under Linex Loss Function
pp. 791-796
Isha Gupta
A
First Order Moving Average Model with Esscher Transformed Laplace
Innovations
pp. 797802
Bindu Krishnan and Dais George
Entropic Order Quantity (EnOQ) Model for Decaying Items with Partial
Backordering and Lost Sale
pp. 803812
Anima Bag, P.K. Tripathy and Monalisha Pattnaik
Robust estimation of skew-normal distribution with location and scale
parameters via log-regularly varying functions
pp. 813822
Shintaro Hashimoto
Pool Testing Algorithm for Estimating Prevalence with Imperfect Test
pp. 823830
Nyongesa L. Kennedy
Designing and Selection of Complete Chain Sampling plans CChSP(0,1)
Indexed Through Inflection point
pp. 831--837
Vijila. M and DevaArul. S